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Day 1 at CES

January 7, 2010 By MicroVision

Hi Everyone,

It’s the close of Day 1 on the show floor at CES. The Microvision booth in the iLounge was constantly busy, and we had a lot of activity in our ‘Dr. Evil lair’ where we highlighted the key advantages of the SHOWWX.

We’ve also garnered a lot of press coverage since we’ve been at CES—from CNET’s First Looks, to accolades from The Cult of Mac, Hardware Zone, Tidbits Tech News, IDG News Service and Wired.com to name a few. Most media give us high marks, but not every reviewer will see us in the same light. Such is the case with today’s review in PC Magazine. While written by someone we greatly respect, we don’t agree with all of his comments and opinions, especially his view on image quality.  We have been in touch with the reviewer questioning and challenging both testing criteria/tools used as well as the rationale for the seemingly harsh words about performance and price.  We know it’s a big wide world out there and despite our disappointment in this one review we take great encouragement from the positive feedback we’ve received both from the media and from the many people who have experienced first-hand other pico projectors—and who have consistently told us that our image quality is the best.

Filed Under: SHOWWX, Tradeshows

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About MicroVision

MicroVision is the creator of PicoP® scanning technology, an ultra-miniature sensing and laser projection solution based on the laser beam scanning methodology pioneered by the company. MicroVision’s platform approach for this advanced sensing and display solution means that it can be adapted to a wide array of applications and form factors. It is an advanced solution for a rapidly evolving, always-on world.

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